Title :
Time interleaved C-2C SAR ADC with background timing skew calibration in 65nm CMOS
Author :
Wang, Lingfeng ; Qiwei Wang ; Carusone, Anthony Chan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Abstract :
This paper presents a 5GS/s 8-bit 40-way time-interleaved SAR ADC fabricated in 65nm CMOS. Two-level hierarchical interleaving is employed, resulting in 4 sub-ADCs each operating at 1.25GS/s at the topmost level with front-end track and hold samplers. The sub-ADCs use capacitive C-2C DACs to minimize the input capacitance and area. A novel background timing skew calibration method is used which requires no redundant signal paths. After calibration, the ADC achieves an SNDR of 33.3dB at Nyquist and consumes 138.6mW from a 1V supply with a 5GS/s sampling rate, yielding an FOM of 738fJ/conv-step. The individual sub-ADC achieves an SNDR of 37.9dB at Nyquist and consumes 34.2mW, yielding an FOM of 428fJ/conv-step.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; digital-analogue conversion; sample and hold circuits; CMOS; analog-to-digital converter; background timing skew calibration method; capacitive C-2C DAC; front-end track and hold samplers; power 138.6 mW; power 34.2 mW; size 65 nm; successive approximation register; time interleaved C-2C SAR ADC; two-level hierarchical interleaving; voltage 1 V; word length 8 bit; Bandwidth; CMOS integrated circuits; Calibration; Capacitance; Clocks; Delays;
Conference_Titel :
European Solid State Circuits Conference (ESSCIRC), ESSCIRC 2014 - 40th
Conference_Location :
Venice Lido
Print_ISBN :
978-1-4799-5694-4
DOI :
10.1109/ESSCIRC.2014.6942058