Title :
A CMOS-Compatible Spectrum Analyzer for Cognitive Radio Exploiting Crosscorrelation to Improve Linearity and Noise Performance
Author :
Oude Alink, Mark S. ; Klumperink, Eric A M ; Kokkeler, André B J ; Soer, Michiel C M ; Smit, Gerard J M ; Nauta, Bram
Author_Institution :
Comput. Archit. for Embedded Syst. (CAES) Group & the IC-Design Group, Univ. of Twente, Enschede, Netherlands
fDate :
3/1/2012 12:00:00 AM
Abstract :
A spectrum analyzer requires a high linearity to handle strong signals, and at the same time a low NF to enable detection of much weaker signals. This is not only important for lab equipment, but also for the spectrum sensing part of cognitive radio, where low cost and integration is at a premium. Often there is a trade-off between linearity and noise: improving one degrades the other. Crosscorrelation can break this trade-off by reducing noise at the expense of measurement time. An existing RF frontend in CMOS-technology with IIP3 = +11 dBm and NF = 5.5 dB is duplicated and attenuators are put in front to increase linearity to IIP3 = +24 dBm. The attenuation degrades NF, but by using crosscorrelation of the outputs of the two frontends, the effective NF is reduced to around 5 dB. In total, this results in a spurious-free dynamic range of 88 dB in 1 MHz resolution bandwidth.
Keywords :
CMOS integrated circuits; attenuators; cognitive radio; correlation methods; integrated circuit noise; performance evaluation; signal detection; spectral analysers; CMOS-compatible spectrum analyzer; RF frontend; attenuators; cognitive radio; crosscorrelation; linearity performance improvement; noise performance improvement; phase noise reduction; signal detection; spectrum sensing; spurious-free dynamic range; Correlation; Linearity; Mixers; Noise; Noise measurement; Receivers; Time measurement; Cognitive radio; IIP3; crosscorrelation; energy detection; linearity; noise figure; phase noise; power detection; spectrum analyzer; spectrum sensing; spurious-free dynamic range;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2011.2167266