DocumentCode :
1373405
Title :
ELDRS: Optimization Tools for the Switched Dose Rate Technique
Author :
Boch, J. ; Velo, Y. Gonzalez ; Saigné, F. ; Roche, N. J -H ; Perez, S. ; Schrimpf, R.D. ; Vaillé, J. -R ; Dusseau, L. ; Mekki, J. ; Lorfèvre, E. ; Ecoffet, R.
Author_Institution :
IES, Univ. Montpellier 2, Montpellier, France
Volume :
58
Issue :
6
fYear :
2011
Firstpage :
2998
Lastpage :
3003
Abstract :
As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.
Keywords :
bipolar logic circuits; materials testing; radiation effects; regression analysis; ELDRS; accelerated test; bipolar devices; device sets; guidelines; low dose rate curve; low dose rate irradiation; optimization tools; switched dose rate technique; Degradation; Extrapolation; Linear regression; Optimization; Pins; Radiation effects; Sensitivity analysis; Accelerated test method; ELDRS; dose rate; switching experiments; total dose;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2011.2171003
Filename :
6075297
Link To Document :
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