Title :
Analyzing the Effects of TID in an Embedded System Running in a Flash-Based FPGA
Author :
Tarrillo, Jimmy ; Azambuja, José Rodrigo ; Kastensmidt, Fernanda Lima ; Fonseca, Evaldo Carlos Pereira ; Galhardo, Rafael ; Goncalez, Odair
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Abstract :
This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.
Keywords :
embedded systems; field programmable gate arrays; flash memories; microprocessor chips; power supply circuits; Actel; SpaceWire links; designed embedded system; flash-based FPGA; function operation; memories; microprocessor; performance degradation; power supply current; temperature operation; total ionizing dose; Embedded systems; Field programmable gate arrays; Microprocessors; Phase locked loops; Radiation effects; SRAM chips; System-on-a-chip; Embedded system; Flash-based FPGA; radiation effects; system on chip; total ionizing dose;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2170855
