Title :
A performance study of some transient detectors
Author :
Wang, Zhen ; Willett, Peter
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
We present a simulation study of several different statistics applied to the detection of unknown transient signals in white Gaussian noise. The results suggest that relatively unsophisticated tests based on temporal localization of power, such as the Page (1954) test and a test based on a new statistic due to Nuttall (see NUWC-NPT Tech. Rep. 11123, 1996, and NUWC-NPT Tech. Rep. 10822, 1997), give reliable results
Keywords :
AWGN; signal detection; statistical analysis; transients; Nuttall maximum processor; Nuttall test statistic; Page test; performance study; simulation study; temporal power localization; transient detectors; transient signals detection; variance-based Page processor; white Gaussian noise; Acoustic emission; Acoustic noise; Detectors; Gaussian noise; Signal processing; Sonar applications; Statistical analysis; Statistics; Stress; Testing;
Journal_Title :
Signal Processing, IEEE Transactions on
