• DocumentCode
    1373719
  • Title

    General Strategies to Design Nanometer Flip-Flops in the Energy-Delay Space

  • Author

    Alioto, Massimo ; Consoli, Elio ; Palumbo, Gaetano

  • Author_Institution
    Dipt. di Ing. dell´´Inf. (DII), Univ. di Siena, Siena, Italy
  • Volume
    57
  • Issue
    7
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    1583
  • Lastpage
    1596
  • Abstract
    In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The proposed design methodology permits to optimize FFs under constraints within the energy-delay space through extensive adoption of the Logical Effort method, which also allows for defining the bounds in the design space search. Transistors sizing is rigorously discussed by referring to cases that occur in practical designs. Appropriate metrics with clear physical meaning are proposed and various interesting properties are derived from circuit analysis. A well-defined design procedure is derived that can be easily automated with commercial CAD tools. In contrast to previous works, the impact of local interconnections is explicitly accounted for in the design loop, as is required in nanometer CMOS technologies. A case study is discussed in detail to exemplify the application of the proposed methodology. Extensive simulations for a typical FF in a 65-nm CMOS technology are presented to show the whole design procedure and validate the underlying assumptions.
  • Keywords
    flip-flops; nanotechnology; network analysis; circuit analysis; design loop; design space search; energy-delay space; logical effort method; nanometer CMOS technology; nanometer flip-flops design; transistor sizing; Energy-delay; energy-efficient design; flip-flops; interconnections; logical effort; nanometer CMOS;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2009.2033538
  • Filename
    5371815