Stability of Injection of a Subnanosecond High-Current Electron Beam and Dynamic Effects Within Its Rise Time

Author

Yalandin, Michael I. ; Reutova, Anna G. ; Sharypov, Konstantin A. ; Shpak, Valery G. ; Shunailov, Sergey A. ; Ul´masculov, Marat R. ; Rostov, Vladislav V. ; Mesyats, Gennady A.

Author_Institution

Inst. of Electrophys., Russian Acad. of Sci., Ekaterinburg, Russia

Volume

38

Issue

10

fYear

2010

Firstpage

2559

Lastpage

2564

Abstract

The stability of the injection of short electron beams and the dynamic processes that occur during their transport were experimentally studied. Beams of energy 200-300 keV, current of 1-1500 A, and duration of 0.05-3 ns with a current rise time of 30-300 ps were formed in a cold-cathode electrode gap. The distribution of the accelerating electric field was highly nonuniform. The cases of vacuum and air insulation of the electron diode were considered. The shortest beams with currents of a few amperes were generated in the mode of continuous acceleration of electrons in atmospheric air. For measuring beam currents, special collector probes were used which ensured a picosecond resolution.

Keywords

air insulation; cathodes; electron probes; particle beam diagnostics; particle beam injection; particle beam stability; relativistic electron beams; vacuum insulation; accelerating electric field distribution; air insulation; atmospheric air; cold-cathode electrode gap; collector probes; current 1 A to 1500 A; dynamic processes; electron continuous acceleration; electron diode; electron volt energy 200 keV to 300 keV; subnanosecond high-current electron beam injection stability; time 0.05 ns to 3 ns; time 30 ps to 300 ps; vacuum insulation; Acceleration; Atmospheric measurements; Current measurement; Diodes; Electrodes; Electron beams; Insulation; Nonuniform electric fields; Particle beams; Stability; Current measurement; electron beams; electron emission; stability;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/TPS.2009.2034858

Filename

5371868