DocumentCode :
1374408
Title :
Gate coupling and floating-body effects in thin-film SOI MOSFETs
Author :
Tsao, S.S. ; Myers, D.R. ; Celler, G.K.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
24
Issue :
4
fYear :
1988
fDate :
2/18/1988 12:00:00 AM
Firstpage :
238
Lastpage :
239
Abstract :
Thin-film, silicon-on-insulator (SOI) MOSFETs exhibit bias-dependent suppression of the kink effect. For zero or positive back gate bias, the well known kink effect is suppressed but the threshold voltage depends strongly on back gate bias. For sufficiently negative back gate bias (as might be required for total-dose radiation-hard applications), the kink effect re-emerges and the threshold voltage depends instead on the applied drain voltage
Keywords :
insulated gate field effect transistors; radiation effects; radiation hardening (electronics); thin film transistors; SIMOX; Si; TFT; applied drain voltage; back gate bias; bias-dependent suppression; floating-body effects; kink effect; radiation effects; thin-film SOI MOSFETs; threshold voltage; total-dose radiation-hard applications;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
Filename :
5629
Link To Document :
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