• DocumentCode
    1374408
  • Title

    Gate coupling and floating-body effects in thin-film SOI MOSFETs

  • Author

    Tsao, S.S. ; Myers, D.R. ; Celler, G.K.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    24
  • Issue
    4
  • fYear
    1988
  • fDate
    2/18/1988 12:00:00 AM
  • Firstpage
    238
  • Lastpage
    239
  • Abstract
    Thin-film, silicon-on-insulator (SOI) MOSFETs exhibit bias-dependent suppression of the kink effect. For zero or positive back gate bias, the well known kink effect is suppressed but the threshold voltage depends strongly on back gate bias. For sufficiently negative back gate bias (as might be required for total-dose radiation-hard applications), the kink effect re-emerges and the threshold voltage depends instead on the applied drain voltage
  • Keywords
    insulated gate field effect transistors; radiation effects; radiation hardening (electronics); thin film transistors; SIMOX; Si; TFT; applied drain voltage; back gate bias; bias-dependent suppression; floating-body effects; kink effect; radiation effects; thin-film SOI MOSFETs; threshold voltage; total-dose radiation-hard applications;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    5629