DocumentCode :
1374604
Title :
In-well ambipolar diffusion in room-temperature InGaAsP multiple quantum wells
Author :
Marshall, Dawn ; Miller, Alan ; Button, Chris C.
Author_Institution :
Sch. of Phys. & Astron., Univ. of St. Andrews, UK
Volume :
36
Issue :
9
fYear :
2000
Firstpage :
1013
Lastpage :
1015
Abstract :
Three-pulse transient amplitude grating experiments were performed using picosecond pulses at 1.525 /spl mu/m on room-temperature InGaAsP multiple quantum wells using a periodically poled LiNbO/sub 3/ (PPLN) optical parametric oscillator. An ambipolar diffusion coefficient of 7.2 cm/sup 2//s was measured from the diffraction efficiency decay rates. We deduce the presence of alloy scattering or an increase in interface scattering when comparing these results with those of similar experiments on GaAs-AlGaAs multiple quantum wells.
Keywords :
III-V semiconductors; diffraction gratings; gallium arsenide; gallium compounds; high-speed optical techniques; indium compounds; light scattering; optical parametric oscillators; semiconductor quantum wells; 1.525 mum; InGaAsP; InGaAsP multiple quantum wells; LiNbO/sub 3/; PPLN optical parametric oscillator; alloy scattering; ambipolar diffusion coefficient; diffraction efficiency decay rates; in-well ambipolar diffusion; periodically poled LiNbO/sub 3/ optical parametric oscillator; room-temperature; room-temperature InGaAsP multiple quantum wells; three-pulse transient amplitude grating; Absorption; Extraterrestrial measurements; Gratings; Nonlinear optics; Optical diffraction; Optical pulses; Optical scattering; Probes; Quantum well devices; Temperature;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.863952
Filename :
863952
Link To Document :
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