Title :
Influence of Shear Stress on Current Carrying Capabilities of High Temperature Superconductor Tapes
Author :
Barth, Christian ; Weiss, Klaus-Peter ; Goldacker, Wilfried
Author_Institution :
Inst. for Tech. Phys., Karlsruhe Inst. of Technol., Eggenstein-Leopoldshafen, Germany
fDate :
6/1/2011 12:00:00 AM
Abstract :
To achieve high currents single HTSC tapes or Roeble strands must be combined into a cable. Many concepts like Rutherford cable, coated cable in conduit or full size cable model of Roebel strands require twisting of the HTSC tapes. Twisting or torsion exerts longitudinal and shear stress on the tapes which degrade the current carrying capabilities. Finite element analysis was done to explain this behavior. However, the influence of longitudinal stress in HTSC tapes on critical current is well documented, but there is no experimental data for pure shear stress available. To verify the finite element analysis shear stress experiments are of significant interest. With a three point bending method shear stress can be applied to a single HTSC tape. Critical current measurements with varying shear stress are conducted for several HTSC tapes. With the experimental results and the longitudinal stress dependence a correlation between torsion experiments and finite element analysis is possible.
Keywords :
finite element analysis; high-temperature superconductors; superconducting cables; superconducting tapes; BSCCO; HTSC tape twisting; Roeble strand cable model; Rutherford cable; YBCO; citical current measurements; coated cable; critical current; current carrying capabilities; finite element analysis; high temperature superconductor tapes; longitudinal stress; shear stress ifluence; three point bending method; torsion experiments; Critical current; Current measurement; Finite element methods; Steel; Stress; Stress measurement; Superconducting films; Electro-mechanical properties; high-temperature superconductors; shear stress; torsion;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2086420