DocumentCode
1375388
Title
Non-destructive testing of materials by microwave systems
Author
Lasri, T. ; Glay, D. ; Mamouni, A. ; Leroy, Y.
Author_Institution
Inst. d´´Electron. et de Microelectron. du Nord, CNRS, Villeneuve d´´Ascq, France
Volume
34
Issue
5
fYear
1998
fDate
3/5/1998 12:00:00 AM
Firstpage
470
Lastpage
471
Abstract
The main objective of this study is to build systems which can, in some cases, be used as an alternative to the automatic network analyser (ANA), to improve the development of microwave characterisation of materials in an industrial context
Keywords
microwave measurement; nondestructive testing; industrial material; microwave system; nondestructive testing;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980393
Filename
674224
Link To Document