Title :
Ridged waveguide to microstrip transition for electromagnetic characterisation of materials in V-band
Author :
Hinojosa, J. ; Kruck, J.F. ; Dambrine, G.
Author_Institution :
Dept. de Electron., Univ. Politecnica de Cartagena, Spain
fDate :
8/17/2000 12:00:00 AM
Abstract :
A high-quality ridged waveguide to microstrip transition for determining the electromagnetic characteristics of thin-film materials in the V-band is presented. Complex permittivity and permeability are computed from S-parameter measurements of a microstrip cell propagating the dominant mode. Measurements in V-band of alumina show good agreement between measured and predicted values
Keywords :
S-parameters; alumina; dielectric thin films; magnetic permeability measurement; microstrip transitions; microwave measurement; permittivity measurement; ridge waveguides; Al2O3; S-parameter measurement; V-band; alumina; electromagnetic wave propagation; permeability; permittivity; ridge waveguide-to-microstrip transition; thin film material;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20001067
