DocumentCode :
1375618
Title :
Testable on-the-fly carry-save multiplier by alternating input data
Author :
Yu, Y.-C. ; Chang, T.-Y.
Author_Institution :
Electron. Res. & Service Org., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
143
Issue :
5
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
345
Lastpage :
348
Abstract :
Montuschi and Ciminiera (1993) presented a carry-save multiplier without final addition. By utilising the don´t-care minterms in the original on-the-fly conversion logic and by modifying the summand circuits, the proposed carry-save multiplier can become a concurrent error detection (CED) scheme using a time redundancy technique, called the `alternating logic´ (AL) approach, under the cell fault model. The AL approach applies normal input data and alternated input data to the circuit under test (CUT) in two consecutive time steps, and both results should be bit-by-bit complemented to each other in the fault-free case; otherwise, the CUT is faulty. With a 1/(8n+14) delay in the normal computation [2/(8n+14) delay for the CED mode], where n is the operand length, the proposed scheme requires about an 18% area overhead and one extra pin
Keywords :
adders; carry logic; circuit testing; delays; design for testability; error detection; multiplying circuits; redundancy; alternating input data; alternating logic; area overhead; bit-by-bit complemented results; carry-save multiplier; cell fault model; circuit under test; computation delay; concurrent error detection scheme; consecutive time steps; don´t-care minterms; extra pin; fault-free case; on-the-fly conversion logic; operand length; summand circuits; testable circuit; time redundancy technique;
fLanguage :
English
Journal_Title :
Computers and Digital Techniques, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2387
Type :
jour
DOI :
10.1049/ip-cdt:19960632
Filename :
537228
Link To Document :
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