• DocumentCode
    1376395
  • Title

    High-linearity and small-chip AlGaAs/GaAs power HBTs for L-band personal digital cellular applications

  • Author

    Chang-Woo Kim ; Hayama, N. ; Goto, N. ; Honjo, K.

  • Author_Institution
    Device Res. Labs., NEC Corp., Ibaraki, Japan
  • Volume
    18
  • Issue
    4
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    147
  • Lastpage
    149
  • Abstract
    A high-linearity AlGaAs/GaAs power heterojunction bipolar transistor (HBT) is developed for personal digital cellular phones. For compact chip layout, thermal design was considered. To improve power performance, proton implantation, optimum alloy condition for collector electrodes, and multiple via holes were used. A 2400-μm2-emitter-area HBT fabricated on a 0.5×0.67 mm2 substrate exhibits adjacent channel leakage powers below -53 dBc for 0.95- and 1.5-GHz /spl pi//4-shifted QPSK modulated input signals at a low collector-emitter voltage of 3.4 V. The HBT produces a 31.7-dBm output power, 50% power-added efficiency, and 15-dB linear power gain at 0.95 GHz, and produced a 31.3-dBm output power, 52% power-added efficiency, and 11.5-dB linear power gain at 1.5 GHz. These results were achieved on about one-fifth of the substrate area of conventional GaAs FETs.
  • Keywords
    III-V semiconductors; UHF bipolar transistors; aluminium compounds; cellular radio; digital radio; gallium arsenide; heterojunction bipolar transistors; ion implantation; power bipolar transistors; 0.95 to 1.5 GHz; 11.5 to 15 dB; 3.4 V; 50 to 52 percent; AlGaAs-GaAs; L-band cellular applications; UHF; collector electrodes; compact chip layout; heterojunction bipolar transistor; high-linearity type; multiple via holes; optimum alloy condition; personal digital cellular phones; proton implantation; small-chip power HBT; thermal design; Cellular phones; Electrodes; Gain; Gallium arsenide; Heterojunction bipolar transistors; L-band; Low voltage; Power generation; Protons; Quadrature phase shift keying;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.563311
  • Filename
    563311