Title :
Determination of bit-rate and sensitivity limits of an optimized p-i-n/HBT OEIC receiver using SPICE simulations
Author :
Kim, Moon Jung ; Kim, Dae Keun ; Kim, Sung June ; Das, Mukunda B.
Author_Institution :
Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
fDate :
4/1/1997 12:00:00 AM
Abstract :
The sensitivity of an OEIC receiver depends essentially on the physical sources of device and circuit noise referred to its input, provided that the inter-symbol interference (ISI) makes no significant contribution. For well designed receivers, the latter situation can be realized only at an optimum bandwidth (f3 dB.opt) for a given bit rate (B) or vice versa. In this paper, we have determined the relationship between the bit rate and the 3-dB bandwidth for negligible and pre-set levels of ISI for an optimized p-i-n/HBT transimpedance receiver with adjustable bandwidth. We have used SPICE simulations in the frequency domain to determine the effect of device and circuit noise, and SPICE transient analysis to determine the effect of ISI on the sensitivity. The ratio f3 dB.opt/B has been found to vary from 0.65 to 0.45 when B changes from 10 to 20 Gbps for the OEIC receiver used
Keywords :
SPICE; bipolar integrated circuits; circuit analysis computing; circuit optimisation; frequency-domain analysis; integrated circuit noise; integrated optoelectronics; intersymbol interference; optical receivers; p-i-n photodiodes; photodetectors; semiconductor device noise; sensitivity; transient analysis; 10 to 20 Gbit/s; 3-dB bandwidth; SPICE simulations; SPICE transient analysis; adjustable bandwidth; bit-rate limit; circuit noise; device noise; frequency domain; inter-symbol interference; optimized p-i-n/HBT OEIC receiver; optimum bandwidth; sensitivity limit; transimpedance receiver; Analytical models; Bandwidth; Bit rate; Circuit noise; Circuit simulation; Heterojunction bipolar transistors; Intersymbol interference; Optoelectronic devices; PIN photodiodes; SPICE;
Journal_Title :
Electron Devices, IEEE Transactions on
