DocumentCode :
1376738
Title :
Information analysis of single photon emission computed tomography with count losses
Author :
Hero, Alfred O. ; Shao, Ling
Author_Institution :
Michigan Univ., Ann Arbor, MI, USA
Volume :
9
Issue :
2
fYear :
1990
fDate :
6/1/1990 12:00:00 AM
Firstpage :
117
Lastpage :
127
Abstract :
An analysis is presented of the information transfer from emitter-space to detector-space in single photon emission computed tomography (SPECT) systems. The analysis takes into account the fact that count loss side information is generally not available at the detector. Side information corresponds to the number γ-rays lost deleted due to lack of interaction with the detector data. It is shown that the information transfer depends on the structure of the likelihood function of the emitter locations associated with the detector data. This likelihood function is the average of a set of ideal-detection likelihood functions, each matched to a particular set of possible deleted γ-ray paths. A lower bound is derived for the information gain due to incorporating the count loss side information at the detector. This is shown to be significant when the mean emission rate is small or when the γ-ray deletion probability is strongly dependent on emitter location. Numerical evaluations of the mutual information, with and without side information, associated with information-optimal apertures and uniform parallel-hole collimators are presented
Keywords :
computerised tomography; radioisotope scanning and imaging; count losses; information analysis; information-optimal apertures; likelihood function; nuclear medicine; single photon emission computed tomography; uniform parallel-hole collimators; Apertures; Collimators; Computed tomography; Distortion measurement; Image reconstruction; Information analysis; Mutual information; Position sensitive particle detectors; Single photon emission computed tomography; Solid scintillation detectors;
fLanguage :
English
Journal_Title :
Medical Imaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0062
Type :
jour
DOI :
10.1109/42.56336
Filename :
56336
Link To Document :
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