DocumentCode
1376788
Title
Effects of quasi-ballistic base transport on the high-frequency characteristics of bipolar transistors
Author
Vaidyanathan, Mani ; Pulfrey, David L.
Author_Institution
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume
44
Issue
4
fYear
1997
fDate
4/1/1997 12:00:00 AM
Firstpage
618
Lastpage
626
Abstract
High-frequency transport in bipolar transistors with quasi-ballistic base widths (on the order of a minority-carrier scattering length) is examined by using the approach of Grinberg and Luryi (1992) to solve the Boltzmann transport equation (BTE). By considering the phase angle of the dynamic distribution function in wave-vector space, it is shown that the ballistic mechanism of decay in the common-base current gain becomes important even for base widths in the quasi-ballistic regime. Simple expressions, which correctly yield both the magnitude and phase of all the forward characteristics, as predicted by the BTE, up to the intrinsic transit frequency, are found by combining the results from a one-flux approach with the well-known expressions of Thomas and Moll (1958). Expressions for the reverse small-signal parameters are also found by applying a “moving boundary condition” to the basic one-flux equations of Shockley (1962)
Keywords
Boltzmann equation; S-parameters; microwave bipolar transistors; minority carriers; semiconductor device models; Boltzmann transport equation; Grinberg-Luryi approach; Thomas-Moll expressions; ballistic decay mechanism; bipolar transistors; common-base current gain; dynamic distribution function; forward characteristics; high-frequency characteristics; intrinsic transit frequency; minority-carrier scattering length; moving boundary condition; one-flux approach; phase angle; quasi-ballistic base transport; reverse small-signal parameters; scattering parameters; Bipolar transistors; Boltzmann equation; Degradation; Distribution functions; Frequency; Helium; Nonuniform electric fields; Scattering parameters;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.563367
Filename
563367
Link To Document