DocumentCode :
1377540
Title :
Direct Measurement of Inter-Filament Resistance in Superconducting Multifilamentary NbTi and {\\rm Nb}_{3}{\\rm Sn} Strands
Author :
Zhou, C. ; van Lanen, E.P.A. ; Veldhuis, D. ; ten Kate, H.H.J. ; Dhallé, M. ; Nijhuis, A.
Author_Institution :
IMPACT Res. Inst., Univ. of Twente, Enschede, Netherlands
Volume :
21
Issue :
3
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
2501
Lastpage :
2504
Abstract :
A quantitative knowledge of inter-filament transverse resistance will allow us to describe current redistribution processes inside strands more accurately. This is particularly important for the analysis of the influence of strain and crack distribution patterns in Nb3Sn filaments on the shape of the voltage-current curves. Several indirect methods are commonly used to assess inter-filament resistance. Here we use a direct method to measure transverse inter-filament resistance and filament-to-matrix contact resistance. Two four-probe voltage-current methods are developed for measurements below 10 K at various background magnetic fields. In addition to FEM (Finite Element Method) simulation, also a new 3D strand model is developed to simulate the current- and voltage distributions. The experimental methods, first results as well as the simulations using the FEM method and new 3D strand model are described.
Keywords :
contact resistance; cracks; finite element analysis; multifilamentary superconductors; niobium alloys; tin alloys; titanium alloys; type II superconductors; 3D strand model; FEM; NbTi-Nb3Sn; crack distribution; filament-to-matrix contact resistance; finite element method; interfilament resistance; strain distribution; superconducting multifilamentary strands; voltage-current methods; Conductivity; Current measurement; Electrical resistance measurement; Resistance; Solid modeling; Superconducting magnets; Wire; 3D strand model; ${rm Nb}_{3}{rm Sn}$; Current distribution; NbTi; inter-filament resistance; proximity effect;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2083619
Filename :
5634121
Link To Document :
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