DocumentCode
1377603
Title
Effective Resistance of a Two Layer Mesh
Author
Köse, Selçuk ; Friedman, Eby G.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
Volume
58
Issue
11
fYear
2011
Firstpage
739
Lastpage
743
Abstract
The effective resistance of a resistive mesh is a commonly used analogy for various scientific and engineering problems such as voltage drop estimation, distributed control including time synchronization and sensor localization, determining the chemical distance among multiple bonds, and finding the distance between two vertices in a graph. Resistive networks are a commonly used structure in electronics to model different elements of an integrated circuit, such as a physical substrate, an integrated circuit layout, and a power distribution network. On-chip power and ground networks are composed of orthogonal metal lines from different metal layers, and a resistive mesh is typically used to model these networks. A two layer mesh is therefore commonly used to analyze IR voltage drops and decoupling capacitor placement. A closed-form expression is described here for the effective resistance between the intersections of a two layer resistive mesh where the horizontal and vertical unit resistances are different. The physical distance between the nodes of interest and the ratio between the horizontal and vertical resistances are included in the expression. The maximum error of the closed-form expression, as compared with the exact solution, is less than 5% for a wide range of . The error further decreases with greater separation between the nodes of interest.
Keywords
capacitors; directed graphs; distributed control; integrated circuit layout; mesh generation; IR voltage drop analysis; closed-form expression; decoupling capacitor placement; distributed control; effective resistance; ground networks; horizontal unit resistances; integrated circuit layout; metal layers; on-chip power; orthogonal metal lines; power distribution network; resistive networks; sensor localization; time synchronization; two layer resistive mesh; undirected graph; vertical unit resistances; voltage drop estimation; Capacitors; Closed-form solutions; Ground support; Integrated circuit modeling; Noise measurement; Power grids; System-on-a-chip; Closed-form solution; effective resistance; noise analysis; power grid; power/ground network;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2011.2168016
Filename
6082412
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