Title :
Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Author :
Faraud, E. ; Pouget, V. ; Shao, K. ; Larue, C. ; Darracq, F. ; Lewis, D. ; Samaras, A. ; Bezerra, F. ; Lorfevre, E. ; Ecoffet, R.
Author_Institution :
IMS, Univ. of Bordeaux, Talence, France
Abstract :
Linear and two-photon laser testing is used to investigate the single-event latchup sensitive depth of SRAM CY7C1069 embedded in CARMEN satellite experiment. Results are discussed and compared with heavy ion and flight data.
Keywords :
SRAM chips; two-photon processes; CARMEN satellite experiment; SRAM CY7C1069; flight data; heavy ion data; linear laser testing; single-event latchup sensitive depth; two-photon absorption laser testing; Laser beams; Lenses; Measurement by laser beam; Optical imaging; SRAM chips; Testing; Laser testing; single event latch-up; two-photon absorption SRAM;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2172222
