DocumentCode
1377915
Title
Deposition of Carbon Nanotubes on CMOS
Author
Wang, Xiaozhi ; Zhang, Yan ; Haque, M. Samiul ; Teo, Ken B K ; Mann, Mark ; Unalan, Husnu Emrah ; Warburton, Paul A. ; Udrea, Florin ; Milne, William I.
Author_Institution
Eng. Dept., Univ. of Cambridge, Cambridge, UK
Volume
11
Issue
2
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
215
Lastpage
219
Abstract
We demonstrate the growth of multi wall and single wall carbon nanotubes (CNT) onto substrates containing commercial 1-μm CMOS integrated circuits. The low substrate temperature growth (450 °C) was achieved by using hot filament (1000 °C) to preheat the source gases (C2H 2 and NH3) and in situ mass spe-ctroscopy was used to identify the gas species present. Field effect transistors based on Single Walled Carbon Nanotube (SWNT) grown under such conditions were fabricated and examined. CNT growth was performed directly on the passivation layer of the CMOS integrated circuits. Individual n- and p-type CMOS transistors were compared before and after CNT growth. The transistors survive and operate after the CNT growth process, although small degradations are observed in the output current (for p-transistors) and leakage current (for both p- and n-type transistors).
Keywords
CMOS integrated circuits; carbon nanotube field effect transistors; carbon nanotubes; chemical vapour deposition; leakage currents; mass spectroscopy; nanofabrication; passivation; C; CMOS integrated circuits; CNT growth; Si; field effect transistors; hot filament; leakage current; mass spectroscopy; multiwall carbon nanotubes; n-type CMOS transistors; p-type CMOS transistors; passivation layer; single walled carbon nanotube; size 1 mum; source gas; substrate temperature growth; temperature 1000 degC; temperature 450 degC; CMOS integrated circuits; CMOS process; Carbon nanotubes; FETs; Helium; Integrated circuit interconnections; MOS devices; Nanotechnology; Plasma temperature; Silicon; CMOSFETs; nanotechnology; temperature control;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2009.2038787
Filename
5373935
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