DocumentCode :
1377922
Title :
Circuit-Level Performance Evaluation of Schottky Tunneling Transistor in Mixed-Signal Applications
Author :
Kim, Jintae ; Jhaveri, Ritesh ; Woo, Jason ; Yang, Chih-Kong Ken
Volume :
10
Issue :
2
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
291
Lastpage :
299
Abstract :
Schottky tunneling source FET (STSFET) is a promising device alternative for future nanometer-scale technology. This paper presents a circuit-level performance evaluation of using STSFET for mixed-signal circuit applications, as well as a design approach that can guide circuit designers to use STSFET optimally. A switched-capacitor track-and-hold amplifier is chosen as a test vehicle, and circuit-level power-performance tradeoff is examined when STSFET is incorporated into the existing array of device types in 90-nm CMOS process. To quantitatively explore the design tradeoff, this paper employs an automated circuit optimization framework using geometric programming, a special type of convex optimization problem. Numerical analysis shows that for our test bench circuit, introducing STSFET, when compared to using devices in 90-nm CMOS process, leads to 30%-50% power reduction, depending on the performance specifications. The analysis also reveals that the full benefit of using STSFET can only be achieved by judiciously choosing device types in a given circuit structure, and the optimal device type selection for a mixed-signal circuit can often be blended using both conventional devices and application-specific devices.
Keywords :
CMOS integrated circuits; Schottky gate field effect transistors; amplifiers; capacitors; circuit optimisation; numerical analysis; CMOS process; STSFET; Schottky tunneling source FET; Schottky tunneling transistor; automated circuit optimization framework; circuit-level power-performance tradeoff; geometric programming; mixed-signal circuit application; numerical analysis; power reduction; switched-capacitor hold amplifier; switched-capacitor track amplifier; Analog circuit; Schottky tunneling source (STS); device type selection; nanometer CMOS;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2009.2039646
Filename :
5373936
Link To Document :
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