Time-stamped transition density for the estimation of delay dependent switching activities

The authors propose a new method called time-stamped transition density to improve the accuracy of the transition density for the estimation of delay dependent switching activities in combinational circuits. It solves the problems of previous methods in dealing with the glitch power and the inertial delay effect. In addition, it can consider the possible delay variation due to the imperfections of the manufacturing process, which has not been considered in previous methods. The experimental results demonstrate the validity of the proposed method