Plasmonic Light Beaming Manipulation and its Detection Using Holographic Microscopy

Author

Lim, Yongjun ; Hahn, Joonku ; Kim, Seyoon ; Park, Junghyun ; Kim, Hwi ; Lee, Byoungho

Author_Institution

Nat. Creative Res. Center for Active Plasmonics Applic. Syst., Seoul Nat. Univ., Seoul, South Korea

Volume

46

Issue

3

fYear

2010

fDate

3/1/2010 12:00:00 AM

Firstpage

300

Lastpage

305

Abstract

Plasmonic off axis beaming and focusing of light by the use of asymmetric or non-periodic dielectric gratings around a metallic slit are experimentally demonstrated. The far-field probing was done by holographic microscopy. While the conventional near-field microscopes can probe only near-fields, our four-step phase-shift interferometer provides an efficient way of probing and reconstructing light paths coming out from the plasmonic devices. We hope our experimental work contributes to the practical applications of plasmonics such as optical interconnection and optical data storage.

Keywords

diffraction gratings; holographic interferometry; laser beams; optical focusing; optical microscopy; plasmonics; dielectric gratings; far-field probing; four-step phase-shift interferometer; holographic microscopy; light focusing; metallic slit; near-field microscopes; optical data storage; optical interconnection; plasmonic devices; plasmonic light beaming manipulation; Dielectrics; Gratings; Holographic optical components; Holography; Microscopy; Optical interconnections; Optical interferometry; Phase shifting interferometry; Plasmons; Probes; Holographic interferometry; plasmonics; surface plasmons;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/JQE.2009.2033717

Filename

5373962