DocumentCode
1378114
Title
Dynamic digital integrated circuit testing using oscillation-test method
Author
Arabi, K. ; Ihs, H. ; Dufaza, C. ; Kaminska, Bozena
Author_Institution
Opmaxx Inc., Beaverton, OR
Volume
34
Issue
8
fYear
1998
fDate
4/16/1998 12:00:00 AM
Firstpage
762
Lastpage
764
Abstract
A new technique to deal with simultaneous testing of delay and stuck-at faults in digital integrated circuits is proposed. It consists of sensitising a path in the digital circuit under test and then incorporating it in a ring oscillator to test for delay and stuck-at faults in the path. This procedure should be exercised for all, or at least critical paths in the circuit. This test technique can be used along with scan techniques or implemented as a complete built-in self-test solution
Keywords
circuit oscillations; delays; digital integrated circuits; integrated circuit testing; logic testing; BIST; built-in self-test; delay faults; digital integrated circuit testing; dynamic digital IC testing; oscillation-test method; ring oscillator; scan techniques; simultaneous testing; stuck-at faults;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980529
Filename
674907
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