• DocumentCode
    1378363
  • Title

    Sub-picosecond wideband efficient saturable absorber created by high energy (200 MeV) irradiation of Au+ ions into bulk GaAs

  • Author

    Mangeney, J. ; Stelmakh, N. ; Shen, A. ; Lourtioz, J.-M. ; Alexandrou, A. ; Likforman, J.-P. ; Clerc, C. ; Thierry-Mieg, V. ; Lugagne-Delpon, E. ; Oudar, Jean-Louis

  • Author_Institution
    CNRS, Orsay
  • Volume
    34
  • Issue
    8
  • fYear
    1998
  • fDate
    4/16/1998 12:00:00 AM
  • Firstpage
    818
  • Lastpage
    820
  • Abstract
    The authors demonstrate, using pump-probe experiments, that defects created by a 200 MeV Au+ ion beam in bulk GaAs reduce the relaxation time of the saturable absorption of the material to as little as 200 fs. The sample absorption is modulated over a spectral width of 50 nm. The integrated value of the absorption modulation thus shows the high absorption efficiency of the irradiated material. A very small variation in relaxation time is found when the density of photocreated carriers is increased to ~5×1018cm-3 . This material appears to be very promising for applications in optical processing and ultrafast measurement at high pulse repetition rates
  • Keywords
    III-V semiconductors; carrier relaxation time; gallium arsenide; gold; high-speed optical techniques; ion implantation; optical saturable absorption; 200 MeV; 200 fs; Au+ ions; GaAs:Au; absorption modulation; bulk III-V semiconductor; density of photocreated carriers; high absorption efficiency; high energy irradiation; high pulse repetition rates; ion implantation; irradiation induced defects; optical processing; pump-probe experiments; relaxation time; saturable absorption; subpicosecond wideband efficient saturable absorber; ultrafast measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19980319
  • Filename
    674945