DocumentCode :
1378825
Title :
Transformerless capacitive coupling of gate signals for series operation of power MOS devices
Author :
Hess, Herbert L. ; Baker, Russel Jacob Jake
Author_Institution :
Idaho Univ., Moscow, ID, USA
Volume :
15
Issue :
5
fYear :
2000
fDate :
9/1/2000 12:00:00 AM
Firstpage :
923
Lastpage :
930
Abstract :
A reliable configuration for triggering a series string of power metal oxide semiconductor (MOS) devices without the use of transformer coupling is presented. A capacitor is inserted between the gate and ground of each metal oxide semiconductor field effect transistor (MOSFET), except for the bottom MOSFET in the stack. Using a single input voltage signal to trigger the bottom MOSFET, a voltage division across the network of device capacitance and inserted capacitances triggers the entire series stack reliably. Design formulas are presented and simple circuit protection is discussed. Simulation shows reliable operation and experimental verification is presented, Application of the method is applied to series insulated gate bipolar transistors (IGBTs)
Keywords :
capacitance; capacitors; insulated gate bipolar transistors; power MOSFET; protection; IGBT; MOSFET; capacitor insertion; circuit protection; device capacitance; gate signals; inserted capacitances; metal oxide semiconductor field effect transistor; power MOS devices; power metal oxide semiconductor devices; series insulated gate bipolar transistors; series operation; series string power MOS devices triggering; single input voltage signal; transformerless capacitive coupling; voltage division; Capacitance; Insulated gate bipolar transistors; Jacobian matrices; MOS devices; MOSFET circuits; Power MOSFET; Power transformer insulation; SPICE; Semiconductor device reliability; Voltage;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/63.867682
Filename :
867682
Link To Document :
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