• DocumentCode
    1379008
  • Title

    980-nm High-Power Low-Divergence VCSELs Achieved by Optimization of Current Density Distribution

  • Author

    Zhang, Xing ; Ning, Yongqiang ; Zeng, Yugang ; Zhang, Jinlong ; Fu, Xihong ; Qin, Li ; Liu, Yun ; Tong, Cunzhu ; Wang, Lijun

  • Author_Institution
    State Key Lab. of Luminescence & Applic., Changchun Inst. of Opt., Fine Mech. & Phys., Changchun, China
  • Volume
    48
  • Issue
    1
  • fYear
    2012
  • Firstpage
    42
  • Lastpage
    48
  • Abstract
    In this paper, we report the design and fabrication of 980-nm vertical-cavity surface-emitting lasers and arrays that provide high output power and low divergence angle without any additional collimating optics. The influence of the structure of the contact on the current density distribution inside the active region was analyzed using the 3-D finite-element method. Uniform current distribution is achieved by optimizing the diameter of the p-contact, and the consequent improvement in beam divergence and thermal behavior is shown. A low divergence angle of 5.4° is obtained for a single device with continuous-wave (CW) power of 1.46 W at room temperature. The 8 × 8 array shows a divergence angle of 10.2° at 4 A with a CW power of 1.95 W. In addition, the measured results were compared with the results from devices without optimization of current density distribution.
  • Keywords
    current density; finite element analysis; surface emitting lasers; 3D finite element method; active region; beam divergence; collimating optics; current 4 A; current density distribution; high-power low-divergence VCSEL; low divergence angle; p-contact; power 1.46 W; power 1.95 W; temperature 293 K to 298 K; thermal behavior; wavelength 980 nm; Apertures; Current density; Laser beams; Optimization; Power generation; Vertical cavity surface emitting lasers; High-power; low-divergence; semiconductor laser arrays; vertical-cavity surface-emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2011.2176719
  • Filename
    6084697