DocumentCode :
1379181
Title :
Parasitic resistance in an MOS transistor used as on-chip decoupling capacitance
Author :
Larsson, Patrik
Author_Institution :
Linkoping Univ., Sweden
Volume :
32
Issue :
4
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
574
Lastpage :
576
Abstract :
Adding on-chip decoupling capacitance has become a popular method to reduce dI/dt noise in integrated circuits. The most area-efficient realization of on-chip capacitance in a standard CMOS process is to use the gate capacitance of MOS transistors. In this paper, the inevitable parasitic resistance of an MOS transistor is estimated, which is important for two reasons. The resistive noise caused by this parasitic must be kept low, and, if properly sized, this resistance can be used to dampen potential resonance oscillations
Keywords :
CMOS integrated circuits; MOSFET; capacitance; electric resistance; integrated circuit noise; integrated circuit packaging; CMOS integrated circuits; MOS transistor; area-efficient realization; dI/dt noise; gate capacitance; on-chip decoupling capacitance; parasitic resistance; potential resonance oscillations; resistive noise; Bonding; Circuit noise; Integrated circuit noise; MOSFETs; Noise generators; Noise reduction; Packaging; Parasitic capacitance; Resonance; Wires;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.563679
Filename :
563679
Link To Document :
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