Title :
Guest editors´ introduction: benchmarking for design and test
Author :
Davidson, S. ; Harlow, J.
Author_Institution :
Sun Microsystems Inc.
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Application specific integrated circuits; Automatic test pattern generation; Benchmark testing; Circuit testing; Circuits and systems; Design for testability; Machinery; Semiconductor device testing; Sun; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2000.867888
