DocumentCode
1379363
Title
Guest editors´ introduction: benchmarking for design and test
Author
Davidson, S. ; Harlow, J.
Author_Institution
Sun Microsystems Inc.
Volume
17
Issue
3
fYear
2000
Firstpage
12
Lastpage
14
Abstract
Presents the guest editorial for this issue of the publication.
Keywords
Application specific integrated circuits; Automatic test pattern generation; Benchmark testing; Circuit testing; Circuits and systems; Design for testability; Machinery; Semiconductor device testing; Sun; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2000.867888
Filename
867888
Link To Document