• DocumentCode
    1379406
  • Title

    First results of ITC´99 benchmark circuits

  • Author

    Basto, Luis

  • Author_Institution
    Analog Devices Inc., Austin, TX, USA
  • Volume
    17
  • Issue
    3
  • fYear
    2000
  • Firstpage
    54
  • Lastpage
    59
  • Abstract
    The ISCAS circuits have long been used as design-for-testability benchmarks; however, recent progress in technology requires newer DFT standards. This look at the ITC´99 benchmarks reveals complexities that will serve as a starting point for other researchers
  • Keywords
    logic testing; performance evaluation; ISCAS circuits; ITC´99 benchmark circuits; ITC´99 benchmarks; design-for-testability; Application specific integrated circuits; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Design automation; Design methodology; Hardware design languages; Logic;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.867895
  • Filename
    867895
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1379406