Title :
Digital-compatible BIST for analog circuits using transient response sampling
Author :
Variyam, Pramodchandran N. ; Chatterjee, Abhijit
Author_Institution :
Mkixed-Signal Wireless Group, Texas Instrum. Inc., Dallas, TX, USA
Abstract :
For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits
Keywords :
analogue circuits; built-in self test; BIST; analog circuits; mixed-signal designs; transient response sampling; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Production; Sampling methods; Space vector pulse width modulation; Transient response;
Journal_Title :
Design & Test of Computers, IEEE
