DocumentCode :
1379471
Title :
Test resource partitioning
Volume :
17
Issue :
3
fYear :
2000
Firstpage :
126
Lastpage :
132
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Logic testing; Resource management; Semiconductor device measurement; System testing; Test equipment;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2000.867903
Filename :
867903
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1379471
