DocumentCode :
1379667
Title :
Electron-Hop-Funnel Measurements and Comparison With the Lorentz-2E Simulation
Author :
Lester, Charles ; Browning, Jim ; Matthews, Lael
Author_Institution :
Dept. of Electr. & Comput. Eng., Boise State Univ., Boise, ID, USA
Volume :
39
Issue :
1
fYear :
2011
Firstpage :
555
Lastpage :
561
Abstract :
Electron hop funnels have been fabricated using a low-temperature cofired ceramic. The measurements of the hop-funnel I-V curve and electron energy distribution have been made using gated field emitters as the electron source. The charged particle simulation Lorentz 2E has been used to model the hop-funnel charging and to predict the - and energy characteristics. The results of this comparison indicate that the simulation can be used to design hop-funnel structures for use in various applications.
Keywords :
electron field emission; surface charging; vacuum microelectronics; Lorentz-2E simulation; electron energy distribution; electron source; electron-hop-funnel measurements; field emission arrays; gated field emitters; hop-funnel I-V curve measurement; hop-funnel charging; hop-funnel structure design; low-temperature cofired ceramic; Anodes; Current measurement; Logic gates; Stability analysis; Steady-state; Surface treatment; Electron emission; surface charging; vacuum microelectronics;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2010.2087775
Filename :
5638153
Link To Document :
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