Title :
Next-generation design and test innovations
Abstract :
This issue of D&T features five articles on next-generation design and test innovations and the associated problems that face the design-and-test community.
Keywords :
MPSoC; design and test; embedded testing; process variation; task mapping; timing analysis;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.110
