DocumentCode
1379828
Title
The ABCs of ITC
Author
Press, Ron ; Volkerink, Erik
Author_Institution
Mentor Graphics
Volume
27
Issue
5
fYear
2010
Firstpage
80
Lastpage
80
Abstract
This year´s ITC, to be held 31 October–5 November in Austin, Texas, will explore the frontiers of test, through advanced research topics and case studies. Additionally, a basic tutorial will cover the fundamentals of test. Panel discussions will focus on why some analog test technologies are taking so long to be adopted, and will provide methods for chip bring-up. An Advanced Industrial Practices session will cover current best practices.
Keywords
Conferences; Meetings; Tutorials; ITC 2010; design and test;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.113
Filename
5638180
Link To Document