Title :
High-Performance Pentacene-Based Thin-Film Transistors and Inverters With Solution-Processed Barium Titanate Insulators
Author :
Wei, Chia-Yu ; Kuo, Shu-Hao ; Huang, Wen-Chieh ; Hung, Yu-Ming ; Yang, Chih-Kai ; Adriyanto, Feri ; Wang, Yeong-Her
Author_Institution :
Inst. of Electro-Opt. Sci. & Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
High-performance pentacene-based thin-film transistors and inverters with solution-processed barium titanate (BTO) insulators are demonstrated. The current-voltage characteristics of the transistors show high mobility of 9.53 cm2 V-1 s-1 at smaller VG = -3.5 V and VD = -5 V, a low threshold voltage of -1.5 V, and a subthreshold slope of 599 mV/dec. Large grain and small crystalline sizes are observed from atomic force microscopy images and X-ray diffraction analysis of pentacene films. The results are verified through Raman spectroscopy and a theoretical Marcus-Hush equation to understand the higher intermolecular coupling, resulting in easier carrier transports in pentacene molecules. In order to investigate the behavior of high-permittivity materials of BTO insulators in a logic circuit, simple and low-operating-voltage inverters are fabricated, and the gain is approximately 8.76 under a small operating voltage range from 0 to -5 V.
Keywords :
insulators; invertors; logic circuits; thin film transistors; Marcus-Hush equation; Raman spectroscopy; X-ray diffraction analysis; atomic force microscopy image; carrier transports; current-voltage characteristics; high-performance pentacene-based thin-film transistors; high-permittivity materials; intermolecular coupling; inverters; logic circuit; pentacene film; pentacene molecules; solution-processed barium titanate insulator; subthreshold slope; Couplings; Insulators; Inverters; Logic gates; Pentacene; Thin film transistors; Barium titanate (BTO); high permittivity; high saturation field-effect mobility; organic inverter; organic thin-film transistor (OTFT); pentacene; solution process;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2174459