• DocumentCode
    1380270
  • Title

    Characterizing three-dimensional surface structures from visual images

  • Author

    Wang, Y.F.

  • Author_Institution
    Dept. of Comput. Sci., California Univ., Santa Barbara, CA, USA
  • Volume
    13
  • Issue
    1
  • fYear
    1991
  • fDate
    1/1/1991 12:00:00 AM
  • Firstpage
    52
  • Lastpage
    60
  • Abstract
    A new technique for computing intrinsic surface properties is presented. Intrinsic surface properties are those properties of a surface that are not affected by the choice of the coordinate system, the position of the viewer relative to the surface, and the particular parametric representation used to describe the imaged surface. Since intrinsic properties are characteristics of a surface, they are ideal for the purposes of representation and recognition. The intrinsic properties of interest are the principal curvatures, the Gaussian curvatures, and the lines of curvature. It is proposed that a structured-light sensing configuration where a grid pattern is projected to encode the imaged surfaces for analysis be adopted. At each stripe junction, the curvatures of the projected stripes on the imaged surface are computed and related to those of the normal sections that share the same tangential directional as the projected curves. The principal curvatures and their directions at the stripe junction under consideration are then recovered using Euler´s theorem. Results obtained using both synthetic and real images are presented
  • Keywords
    computer vision; computerised pattern recognition; computerised picture processing; Euler theorem; Gaussian curvatures; coordinate system; grid pattern; intrinsic surface properties; lines of curvature; normal sections; parametric representation; principal curvatures; projected stripes; real images; stripe junction; structured-light sensing configuration; surface recognition; surface representation; synthetic images; tangential directional; three-dimensional surface structures; visual images; Cameras; Character recognition; Computer science; Equations; Image analysis; Layout; Pattern analysis; Radiometry; Shape; Surface structures;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.67630
  • Filename
    67630