Title :
A wide-bandwidth Si/SiGe HBT direct conversion sub-harmonic mixer/downconverter
Author :
Sheng, Liwei ; Jensen, Jonathan C. ; Larson, Lawrence E.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
A wideband sub-harmonic mixer/direct-conversion downconverter is implemented in a Si/SiGe HBT technology, with improved rejection of the local oscillator (LO), high input intercept point, and low current requirements. The circuit utilizes a combination of phase shifters operating at 45/spl deg/ and 90/spl deg/ to achieve better than 33-dB input-referred rejection of the LO. The measured third-order input intercept point (IIP3) was approximately -3 dBm and the second-order input intercept point (IIP2) was roughly 35 dBm, with a measured double sideband (DSB) noise figure of 7.8 dB. A comparison was made between devices of differing germanium concentration in the base, and the devices with higher Ge content exhibited improved noise figure and gain. Each mixer required approximately 2.8 mA from a 3.3 V supply.
Keywords :
Ge-Si alloys; MMIC frequency converters; MMIC mixers; MMIC phase shifters; UHF frequency converters; UHF integrated circuits; UHF mixers; UHF phase shifters; bipolar MMIC; bipolar analog integrated circuits; elemental semiconductors; heterojunction bipolar transistors; integrated circuit noise; low-power electronics; radio receivers; semiconductor materials; silicon; 1 to 2 GHz; 2.8 mA; 3.3 V; 7.8 dB; DSB noise figure; IIP2; IIP3; LO rejection; Si-SiGe; Si/SiGe HBT technology; direct conversion mixer/downconverter; high input intercept point; local oscillator rejection; low current requirements; phase shifters; second-order input intercept point; sub-harmonic mixer/downconverter; third-order input intercept point; wide-bandwidth operation; Circuits; Germanium silicon alloys; Heterojunction bipolar transistors; Local oscillators; Noise figure; Noise measurement; Phase measurement; Phase shifters; Silicon germanium; Wideband;
Journal_Title :
Solid-State Circuits, IEEE Journal of