Title :
Effects of Stress and Depolarization on Electrical Behaviors of Ferroelectric Field-Effect Transistor
Author :
Chen, Y.Q. ; En, Y.F. ; Huang, Y. ; Kong, X.D. ; Fang, W.X. ; Zheng, X.J.
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., No. 5 Electron. Res. Inst., Guangzhou, China
Abstract :
The effects of stress and depolarization on current-voltage characteristics of ferroelectric field-effect transistor (FeFET) were investigated by Landau-Khalatnikov theory in conjunction with Pao and Sah´s model. Output characteristics current increases under compressive stress but decreases under tensile stress. Transfer characteristics curve is enlarged by compressive stress but compressed by tensile stress, and it shifts to the negative voltage axis under compressive stress gradient while to the opposite direction under tensile stress gradient. Because of depolarization, output characteristics current is obviously affected, and transfer characteristics curve is seriously distorted. These results show that stress and depolarization should be considered in device design to prevent failure of FeFET.
Keywords :
field effect transistors; gradient methods; FeFET; Landau-Khalatnikov theory; Pao model; Sah model; compressive stress gradient; current-voltage characteristics; depolarization effects; electrical behaviors; ferroelectric field-effect transistor; negative voltage axis; stress effects; tensile stress gradient; transfer characteristic curve; Compressive stress; Hysteresis; Mathematical model; Shape; Tensile stress; Transistors; Current–voltage characteristics; depolarization; ferroelectric field-effect transistor (FeFET); stress;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2011.2171915