Title :
Low-Cost Displays—Semiconductor and Lithographic Performance Requirements
Author :
Redinger, David H. ; Schnobrich, Scott ; Haase, Michael A.
Author_Institution :
Corp. Res. Mater. Lab., 3M Co., St. Paul, MN, USA
Abstract :
The field of low-cost flexible displays has attracted an enormous amount of interest in the past few years. This paper analyzes the challenges associated with designing a backplane for an electrophoretic front plane and develops a general model which relates semiconductor and lithographic performance metrics to display qualities such as speed, uniformity, and resolution. Specific examples are given for all ink-jet printed displays as well as for partially or all photolithographically patterned displays.
Keywords :
electrophoretic displays; flexible displays; photolithography; electrophoretic front plane; ink-jet printed display; lithographic performance metrics; lithographic performance requirement; low-cost flexible display; photolithographically patterned display; semiconductor performance metrics; semiconductor performance requirement; Backplanes; Ink jet printing; Logic gates; Thin film transistors; Active-matrix electrophoretic display (AMEPD); flexible; response time; thin-film transistors (TFTs);
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2010.2084070