Title :
Electrical protection for transistorized equipment
Author :
Bodle, D. W. ; Hays, J. B.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
fDate :
7/1/1959 12:00:00 AM
Abstract :
The trend to miniaturization of components and the expanding use of transistor circuitry in communication equipment has necessitated the development of new protection measures capable of limiting foreign potentials and currents to values much lower than has heretofore been necessary.
Keywords :
Capacitance; Electric breakdown; Junctions; Lightning; Semiconductor diodes; Surge protection; Surges;
Journal_Title :
American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
DOI :
10.1109/TCE.1959.6372989
