Title :
Corrections to “Transforming Traditional Iris Recognition Systems to Work in Nonideal Situations” [Aug 09 3203-3213]
Author :
Zhou, Zhengchun ; Du, Yun ; Belcher, C.
Author_Institution :
Biometrics and Pattern Recognition Laboratory, Department of Electrical and Computer Engineering, Indiana University-Purdue University Indianapolis, Indianapolis, USA
Abstract :
The authors of the above titled paper (ibid., vol 56, no. 8, pp. 3203-3213, Aug. 09) point out that the credits for Figs. 14 and 17 were missing in the final print version. These two figures were edited from the figures in another paper (see ref. [2]) and used to introduce the background of the Multimodal Biometrics Grand Challenge organized by the National Institute of Standards and Technology.
Keywords :
Biometrics; Electrons; Iris recognition; NIST; Pattern recognition;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2009.2031160