DocumentCode :
138119
Title :
Electrical characteristics evolution of the Deep Trench Termination diode based on a finite elements simulation approach
Author :
Baccar, F. ; Le Henaff, Francois ; Theolier, L. ; Azzopardi, Stephane ; Woirgard, Eric
Author_Institution :
IMS Lab., Univ. of Bordeaux, Talence, France
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
1
Lastpage :
7
Abstract :
The main contribution of this work consists in showing the possibility to use the Cyclotene 4026-46 BCB (BenzoCycloButen) resin in thick layer to realize Deep Trench Termination (DT2). The development of the DT2 in power devices strongly depends on its reliability. 2D finite elements simulations were used to determinate the electrical characteristics after mechanical stresses created in the structure. It appears that void created inside the structure does not affect the structure´s characteristic; however it changes when a quantity of charge was added at interface Silicon/BCB.
Keywords :
finite element analysis; passivation; power semiconductor diodes; resins; 2D finite elements simulations; benzocyclobuten resin; cyclotene 4026-46 BCB resin; deep trench termination diode; electrical characteristics evolution; finite elements simulation approach; interface silicon/BCB; mechanical stresses; power devices; structure characteristic; Abstracts; Anodes; Capacitance; Cathodes; Isothermal processes; Microelectronics; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
Type :
conf
DOI :
10.1109/EuroSimE.2014.6813814
Filename :
6813814
Link To Document :
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