Transistor amplifier stages with prescribed gain and static and dynamic sensitivity

The many and varied aspects of transistor amplifier sensitivity to changes in temperature and transistor unit replacement have received considerable attention in the literature. Numerous investigations have been reported pertaining to the thermal displacement of the transistor operating point and the variation of its incremental parameters with the shift of the operating point and with temperature.1¿5, 7, 10¿16 Furthermore, various schemes for stabilizing the operating point have been considered in detail,3,7,8,9,12¿16 and design procedures for specific as well as generalized bias network configurations to effect this stabilization have been proposed.3,6,8,12,16