DocumentCode :
138179
Title :
System-level-model development of an SWCNT based piezoresistive sensor in VHDL-AMS
Author :
Kolchuzhin, Vladimir ; Mehner, J. ; Markert, Erik ; Heinkel, Ulrich ; Wagner, Christoph ; Schuster, Jorg ; Gessner, T.
Author_Institution :
Fac. for Electr. Eng. & Inf. Technol., Microsyst. & Precision Eng., Chemnitz Univ. of Technol., Chemnitz, Germany
fYear :
2014
fDate :
7-9 April 2014
Firstpage :
1
Lastpage :
6
Abstract :
This article deals with the model development for a single walled carbon nanotube (SWCNT) piezoresistive sensor at system level design. The framework of VHDL-AMS is used for implementation and simulation, consisting of compact submodels that describe components performing heterogeneous functions. The SWCNT mechanical and electrical compact models presented in the article are based on the analytical model, lumped element model and the simulation results based on density functional theory (DFT). The macromodels of the MEMS are built using a reduced order modeling technique based on finite element simulations. This article presents and discusses the most important aspects of the development of system models and essential model parameters.
Keywords :
carbon nanotubes; computerised instrumentation; density functional theory; finite element analysis; hardware description languages; microsensors; mixed analogue-digital integrated circuits; nanosensors; piezoresistive devices; reduced order systems; C; DFT; MEMS; SWCNT based piezoresistive sensor; SWCNT electrical compact model; SWCNT mechanical compact model; VHDL-AMS; compact submodel; density functional theory; finite element simulation; heterogeneous function; lumped element model; macromodel; model parameter; reduced order modeling technique; single walled carbon nanotube; system level design; system level model development; Abstracts; Atomic measurements; Conductors; Couplings; Deformable models; Electrostatics; Gold;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2014 15th international conference on
Conference_Location :
Ghent
Print_ISBN :
978-1-4799-4791-1
Type :
conf
DOI :
10.1109/EuroSimE.2014.6813846
Filename :
6813846
Link To Document :
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