DocumentCode :
1381908
Title :
Face Recognition Using Nearest Feature Space Embedding
Author :
Chen, Yin-Nong ; Han, Chin-Chuan ; Wang, Cheng-Tzu ; Fan, Kuo-Chin
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Jhongli, Taiwan
Volume :
33
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
1073
Lastpage :
1086
Abstract :
Face recognition algorithms often have to solve problems such as facial pose, illumination, and expression (PIE). To reduce the impacts, many researchers have been trying to find the best discriminant transformation in eigenspaces, either linear or nonlinear, to obtain better recognition results. Various researchers have also designed novel matching algorithms to reduce the PIE effects. In this study, a nearest feature space embedding (called NFS embedding) algorithm is proposed for face recognition. The distance between a point and the nearest feature line (NFL) or the NFS is embedded in the transformation through the discriminant analysis. Three factors, including class separability, neighborhood structure preservation, and NFS measurement, were considered to find the most effective and discriminating transformation in eigenspaces. The proposed method was evaluated by several benchmark databases and compared with several state-of-the-art algorithms. According to the compared results, the proposed method outperformed the other algorithms.
Keywords :
face recognition; feature extraction; pose estimation; discriminant analysis; discriminant transformation; eigenspaces; face recognition; facial pose illumination and expression; nearest feature line; nearest feature space embedding; Algorithm design and analysis; Face; Face recognition; Laplace equations; Principal component analysis; Prototypes; Training; Face recognition; Fisher criterion; Laplacianface.; nearest feature line; nearest feature space; Algorithms; Artificial Intelligence; Discriminant Analysis; Face; Humans; Image Enhancement; Information Storage and Retrieval; Lighting; Pattern Recognition, Automated;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2010.197
Filename :
5639012
Link To Document :
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