DocumentCode :
1381945
Title :
SAW device modeling including velocity dispersion based on ZnO/diamond/Si layered structures
Author :
Hachigo, Akihiro ; Malocha, Donald C.
Author_Institution :
Itami Res. Labs., Sumitomo Electr. Ind. Ltd., Hyogo, Japan
Volume :
45
Issue :
3
fYear :
1998
fDate :
5/1/1998 12:00:00 AM
Firstpage :
660
Lastpage :
666
Abstract :
Surface acoustic wave (SAW) filter properties of ZnO/diamond/Si structures are calculated including velocity dispersion. The conventional SAW device modeling has previously been developed for bulk substrates. However, layered materials exhibit SAW velocity dispersion. The null frequency bandwidth of typical layered ZnO/diamond/Si structures is narrower than that calculated by conventional SAW device modeling techniques due to the velocity dispersion of the layered structures. The null frequency bandwidth of layered structures was calculated by the delta function model and the equivalent circuit model, including velocity dispersion, and compared with the experimental results. The dispersive equivalent circuit (DEC) model for layered structures is also presented. The results of these analysis are compared with the experimental results which show very good agreement.
Keywords :
diamond; equivalent circuits; silicon; surface acoustic wave filters; ultrasonic dispersion; ultrasonic velocity; zinc compounds; SAW device; ZnO-C-Si; delta function model; device modeling; equivalent circuit model; filter properties; layered structures; null frequency bandwidth; velocity dispersion; Dispersion; Electrodes; Equations; Equivalent circuits; Frequency response; Hafnium; Piezoelectric transducers; Surface acoustic wave devices; Surface acoustic waves; Zinc oxide;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.677610
Filename :
677610
Link To Document :
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