DocumentCode
1382076
Title
High-Q sapphire-rutile frequency-temperature compensated microwave dielectric resonators
Author
Tobar, Michael E. ; Krupka, Jerzy ; Hartnett, John G. ; Ivanov, Eugene N. ; Woode, Richard A.
Author_Institution
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
Volume
45
Issue
3
fYear
1998
fDate
5/1/1998 12:00:00 AM
Firstpage
830
Lastpage
836
Abstract
A sapphiro-rutile composite resonator was constructed from a cylindrical sapphire monocrystal with two thin disks of monocrystal rutile held tightly against the ends. Because rutile exhibits low loss and an opposite temperature coefficient of permittivity to sapphire, it is an ideal material for compensating the frequency-temperature dependence of a sapphire resonator. Most of the electromagnetic modes in the composite structure exhibited turning points (or compensation points) in the frequency-temperature characteristic. The temperatures of compensation for the WG quasi TM modes were measured to be below 90 K with Q-factors of the order of a few million depending on the mode. For WG quasi TE modes, the temperatures of compensation were measured to be between 100 to 160 K with Q-factors of the order of a few hundreds of thousands, depending on the mode. The second derivatives of the compensation points were measured to be of the order 0.1 ppm/K/sup 2/, which agreed well with the predicted values.
Keywords
Q-factor; compensation; dielectric resonators; sapphire; titanium compounds; Al/sub 2/O/sub 3/-TiO/sub 2/; Q-factor; WG quasi TE mode; WG quasi TM mode; compensation point; electromagnetic mode; frequency-temperature compensation; loss; microwave dielectric resonator; monocrystal; sapphire-rutile composite resonator; temperature coefficient of permittivity; turning point; Building materials; Crystalline materials; Dielectric materials; Dielectric measurements; Microwave frequencies; Permittivity; Q factor; Tellurium; Temperature dependence; Turning;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.677747
Filename
677747
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