• DocumentCode
    1382117
  • Title

    Reliability investigations on conductive adhesive joints with emphasis on the mechanics of the conduction mechanism

  • Author

    Dudek, Rainer ; Berek, Harry ; Fritsch, Thomas ; Michel, Bernd

  • Author_Institution
    Fraunhofer Inst., Berlin, Germany
  • Volume
    23
  • Issue
    3
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    462
  • Lastpage
    469
  • Abstract
    The isotropic conductive adhesive (ICA) mounting technology is of growing interest, but reliability concerns are still preventing its broad application. Reports on environmental testing results are related to both high temperature storage and thermal cycling. Additionally, the influence of moisture has been investigated for both pressure cooker test and humidity storage with exposure times up to several weeks. In an ICA, the conductive particles are embedded in a polymeric matrix material, where they can form conductive paths. This mechanical part of the conductive mechanism was studied in more detail using a finite element (FE-) model, because only a little information is available on this subject. A joint of a chip resistor on an organic board was selected for the model. The conductive adhesive is not treated as a homogeneous material, but split into the polymeric matrix material and idealized conductive particles. A temperature dependent viscoelastic constitutive description has been used to model the epoxy behavior. Additionally, moisture diffusion analyzes of the adhesive joints were conducted. The contacting pressure of the particles is shown to depend on cure shrinkage, temperature changes, and moisture swelling effects
  • Keywords
    adhesives; conducting polymers; environmental testing; finite element analysis; moisture; reliability; swelling; viscoelasticity; chip resistor; conduction mechanism; conductive adhesive joints; conductive paths; contacting pressure; cure shrinkage; environmental testing results; epoxy behavior; exposure times; finite element model; high temperature storage; humidity storage; idealized conductive particles; isotropic conductive adhesive; moisture; moisture diffusion analyzes; moisture swelling effects; mounting technology; organic board; polymeric matrix material; pressure cooker test; reliability; thermal cycling; viscoelastic constitutive description; Active matrix organic light emitting diodes; Conducting materials; Conductive adhesives; Finite element methods; Humidity; Independent component analysis; Moisture; Polymers; Temperature dependence; Testing;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.868845
  • Filename
    868845